SKM 2023 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 13: Optical Analysis of Thin Films I
DS 13.5: Vortrag
Donnerstag, 30. März 2023, 10:45–11:00, SCH A 316
Orientation in thin spider silk films at silicon substrates evidenced by dichroic FTIR spectroscopy — •Martin Müller1,2, Mirjam Hofmaier1,3, Sarah Lentz4, Thomas Scheibel4, and Andreas Fery1,3 — 1Leibniz-Institut für Polymerforschung Dresden e.V., Institut für Physikalische Chemie und Physik der Polymere, Dresden, Germany — 2Technische Universität Dresden, Lehrstuhl für Makromolekulare Chemie, Dresden, Germany — 3Technische Universität Dresden, Lehrstuhl für Physikalische Chemie Polymerer Materialien, Dresden, Germany — 4Universität Bayreuth, Lehrstuhl für Biomaterialien, Bayreuth, Germany
Biomedically relevant spider silk films were deposited on unscratched and parallelly scratched silicon substrates and checked for conformation and orientation by dichroic transmission (T-) and ATR-FTIR spectroscopy. Films (d=0-200 nm) were casted from hexafluoroisopropanol solutions of recombinantly engineered spider silk proteins. Both FTIR methods revealed little b-sheet (<10%) and much disordered structure (>80%) from Amide I band analysis. Dichroic ratios R of Amide I components close to isotropic films were found by T- and ATR-FTIR indicating no orientation. Whereas, silk films after swelling in MeOH vapor revealed higher b-sheet (>30%) and lower disordered structure amounts (<60%). By T-FTIR isotropic R values of Amide I components assigned to antiparallel b-sheet were found indicating no in-plane orientation, while ATR-FTIR revealed R values significantly deviating from isotropy indicating out-of-plane orientation. Orientation was independent on scratching and increased decreasing d.