SKM 2023 – wissenschaftliches Programm
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 13: Polar Oxide Crystals and Solid Solutions I
KFM 13.7: Vortrag
Donnerstag, 30. März 2023, 12:15–12:35, POT 106
Looking undercover - Probing subsurface properties by Piezoresponse force microscopy (PFM) — •Matthias Roeper1, Samuel D. Seddon1, Lili Ding1, Michael Rüsing1, and Lukas M. Eng1,2 — 1Institut für Angewandte Physik, TU Dresden, Nöthnitzer Straße 61, 01187 Dresden, Germany — 2ct.qmat: Dresden-Würzburg Cluster of Excellence - EXC 2147, TU Dresden, 01062 Dresden, Germany
Piezoresponse force microscopy (PFM) is one of the most widespread methods for investigating and visualizing ferroelectric domain structures at the nanometer length scale, even along all 3 dimensions (3D) [1]. PFM couples to the local dielectric displacement that is present near the sample surface, and hence is also sensitively probing into the bulk of the sample under investigation, i.e. into a subsurface volume with penetration d [2]. In this work, we systematically analyze in both theory and experiment, the contrast and depth resolution capabilities of PFM as a function of the various relevant experimental parameters. PFM tool properties such as the tip radius, ac driving voltage, and ac frequency were optimized, while equally dedicated sample structures incorporating (known) buried features, i.e. ferroelectric domain walls, fabricated into the bulk host at a distance d below the surface, were analyzed Our finding allow to accurately adjust the image contrast to a certain penetration depth d, and thus quantify those local features with high precision.
[1] L. M. Eng et al., Appl. Phys. Lett. 74, 233 (1999) [2] F. Johann et al., Appl. Phys. Lett. 94, 172904 (2009)