SKM 2023 – wissenschaftliches Programm

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 5: Thin Film Properties (joint session DS/KFM)

KFM 5.3: Vortrag

Dienstag, 28. März 2023, 10:30–10:45, SCH A 315

Ferroelectric thin films studied by X-ray standing waves — •Le Phuong Hoang¹, Irena Spasojevic², David Pesquera², Gustau Catalan², Kai Rossnagel^3,5, Jörg Zegenhagen⁴, Tien-Lin Lee⁴, Ivan Vartanyants⁵, Andreas Scherz¹, and Giuseppe Mercurio¹ — ¹European XFEL, Schenefeld, Germany — ²Catalan Institute of Nanoscience and Nanotechnology, Barcelona, Spain — ³Christian-Albrechts-Universität zu Kiel, Kiel, Germany — ⁴Diamond Light Source, Didcot, UK — ⁵Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany

We investigated the structural properties of ferroelectric BaTiO₃ thin films by X-ray standing waves with the goal to determine the atomic positions within the tetragonal unit cell in samples with different strain. Our samples consist of BaTiO₃ thin films grown by pulsed laser deposition (with a SrRuO₃ bottom electrode) on three different substrates SmScO₃, GdScO₃, DyScO₃ providing increasing compressive strain. All the samples were characterized by X-ray reflectivity (XRR) and reciprocal space mapping (RSM). We present X-ray photoelectron spectroscopy, X-ray diffraction and X-ray standing waves data measured at the Diamond Light Source that provide Ba and Ti atomic positions within the unit cells of sample surface. In this study we show a relation between atomic positions and compressive strain of ferroelectric BaTiO₃ thin films.