SKM 2023 – wissenschaftliches Programm

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MA: Fachverband Magnetismus

MA 43: Magnetic Imaging Techniques II

MA 43.2: Vortrag

Donnerstag, 30. März 2023, 15:15–15:30, HSZ 401

Soft X-ray ptychography of micrometer thick samples — •Jeffrey N. Neethirajan¹, Benedikt Daurer², Ales Hrabec^3,4, Majid Kazemian², Marisel Di Pietro Martínez¹, Burkhard Kaulich², and Claire Donnelly¹ — ¹Max Planck Institute for Chemical Physics of Solids, Dresden, Germany — ²Diamond Light Source, Harwell Science and Innovation Campus, Didcot, United Kingdom — ³Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, Zurich, Switzerland — ⁴Laboratory for Multiscale Materials Experiments, Paul Scherrer Institute, Switzerland

Magnetism at the nanoscale offers a playground to study topology in real space. Although topological spin textures have so far been mainly studied in 2D, there is a growing interest in 3D topological spin textures. Recently, 3D imaging of extended systems with hard X-rays has revealed topological singularities called Bloch points and spin structures called vortex rings with nanoscale spatial resolution. However, the imaging of extended systems with hard X-rays is limited by the weak XMCD signals observed in this regime and restricted currently to a few rare-earths. In contrast, soft X-rays offer a stronger XMCD signal but limited to imaging samples that are 200-300 nm thick. Here we demonstrate the imaging of micrometer thick samples using soft X-ray ptychography - accessing a thickness regime previously impractical with conventional soft X-ray imaging techniques. This result is a step forward in realizing 3D imaging of extended systems with soft X-rays which offers a strong XMCD signal and the possibility to image exotic systems hosting topological textures.