SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 12: Scanning Probe Techniques: Method Development I

O 12.5: Vortrag

Montag, 27. März 2023, 16:00–16:15, GER 37

Interplay between magnetic and electrostatic forces when imaging complex current carrying stripline geometries with Magnetic Force Microscopy — Denis Goman, Dhavalkumar Mungpara, and •Alexander Schwarz — Institute of Nanostructure and Solid State Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg

Current carrying strip-lines have been oftentimes used to calibrate the sensitivity of magnetic tips to perform quantitative magnetic force microscopy, because for this system the Oersted field can be calculated analytically. In these investigations possible electrostatic contribution to the measured signal have been usually ignored.

Our research focuses on more complex strip-line arrangements with meander and spiral geometries, which are part of a magnetometer. Current dependent magnetic force microscopy (MFM) images clearly show that the measured signal possesses a large electrostatic contribution, which, in a peculiar fashion, depends on the tip location. We find that electrostatic contributions stem from three sources: (i) the contact potential difference between strip-line and substrate material, (ii) the potential drop along the strip-line and (iii) an edge effect related to the finite size of the tip apex. This knowledge helps to disentangle magnetostatic and electrostatic contributions even for rather complex strip-line geometries.

This work has been conducted as part of the OXiNEMS project, which has received funding from the European Union`s Horizon 2020 research and innovation program under Grant Agreement No. 828784.