SKM 2023 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 12: Scanning Probe Techniques: Method Development I
O 12.8: Vortrag
Montag, 27. März 2023, 16:45–17:00, GER 37
Polarization-sensitive scanning near-field optical microscopy — •Felix G. Kaps1,2, Susanne C. Kehr1,2, and Lukas M. Eng1,2 — 1Technische Universität Dresden, Germany — 2Würzburg-Dresden Cluster of Excellence - EXE 2147 (ct.qmat), Dresden, Germany
Scanning near-field optical microscopy (SNOM) enables nanoscopic optical surface characterization at visible, infrared, and THz wavelengths [1], with applications to various research fields e.g. 2D materials, semiconductors, and in biology [2]. Here, typically the pure out-of-plane field components are considered. For resonant samples however, near-field excitation of all vectorial components becomes possible [3], enabling the full polarization analysis at the nanometer length scale.
In the work presented here, we examine the polarization-dependent near-field response of both non-resonantly (Au) and resonantly (SiC) excited samples at around 10.6 µm. By varying the incident linear polarization direction from s- to p-polarization, we are able to capture differently scattered near-field contributions, showing up in characteristic lobe-shaped polarization signatures. These results are confirmed by theoretical simulations, where we combine the analytic dipole model [5] and the Jones matrix formalism. Comparing the experiment with our simulations, we are able to disentangle the near-field‘s vectorial contributions via spectral and polarization analysis.
[1] T. Nörenberg etal., ACS Nano, article ASAP (2022)
[2] T.V.A.G. de Olivera et al., Adv. Mater. 33, 2005777 (2021).
[3] H. Aminpour et al., Opt. Express 28, 32316 (2020)