SKM 2023 – scientific programme
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O: Fachverband Oberflächenphysik
O 13: Focus Session: Ion Beam Interaction with Surfaces and 2D Materials II
O 13.4: Talk
Monday, March 27, 2023, 16:00–16:15, GER 38
MeV-SIMS: mass spectrometry with ultra-fast projectiles — •Lars Breuer1, Tobias Heckhoff1, David Theuner1, Frieder Koch2, and Andreas Wucher1 — 1Universität Duisburg-Essen — 2GSI Helmholtzzentrum für Schwerionenforschung
While secondary ion mass spectrometry has become a standard tool in surface analysis, it still offers multiple challenges. While ionization probabilities are usually fairly low and may be altered by the chemical environment of the target surface, fragmentation of molecules introduces even more experimental challenges. Therefore, better understanding of the underlying processes and methodology improvement is an ongoing topic of research. Here, we present strategies developed to shed light on the fundamental processes in sputtering of different materials from metals and insulators to organic samples by tuning the contribution of nuclear and electronic sputtering. For that purpose, a time-of-flight spectrometer has been coupled to the M-Branch of the UNILAC at GSI in Darmstadt, using swift heavy ions as projectiles. By laser post-ionization not only secondary ions are accessible but their neutral counterparts as well to enable us to gain insight into sputtering and ionization under extreme conditions.