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SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 14: Nanostructures at Surfaces (joint session O/CPP)

O 14.8: Vortrag

Montag, 27. März 2023, 16:45–17:00, GER 39

A Holistic Characterisation of Bi Thin Films on Au(111) — •Pablo Vezzoni Vicente1, Tobias Weiß1, Marc Gonzalez-Cuixart4, Dennis Meier1, Benedikt Klein2, David Duncan2, Ezequiel Tosi3, Paolo Lacovig3, Silvano Lizzit3, Johannes Barth1, Peter Feulner1, and Francesco Allegretti11Physics Department E20, Technische Universität München, Germany — 22I09 beamline, Diamond Light Source, United Kingdom — 33SuperESCA beamline, Elettra Synchrotron, Italy — 44IMDEA Nanociencia, Spain

We present a comprehensive analysis of the long-range ordered, coverage-dependent phases of Bi epitaxially grown on a Au(111) surface in UHV, from the sub-monolayer (√37×√37)R25.3 Kagome lattice up to few-layer Bi(110) thin films. Particular focus is devoted to the sub-monolayer, high-coverage (p×√3) phase, paving the way to its use as a buffer layer for epitaxial growth with tunable geometry and low electronic interaction.

Our work clarifies and expands the current literature reports, specifically on the complex (p×√3) phase. The wide range of analysis techniques used, including Low-Energy Electron Diffraction (LEED), Photo-Electron Spectroscopy (XPS, UPS), Temperature Programmed Desorption (TPD), Scanning Tunneling Microscopy and Spectroscopy (STM, STS), and X-ray Standing Waves (XSW), yields an unprecedented understanding of the system’s structural and electronic properties.

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