SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 26: Poster: New Methods

O 26.8: Poster

Montag, 27. März 2023, 18:00–20:00, P2/EG

Development of a reflektometer for polarised surface sensitive X-ray Absorption Spectroskopy — •Lukas Voß, Frederic Braun, Franz Eckelt und Dirk Lützenkirchen-Hecht — Bergische Universität Wuppertal, Wuppertal, Deautschland

ReflEXAFS measurements represent a powerful tool for surface-sensitive structure investigations. With the help of high-intensity synchrotron radiation on synchrotron beamlines of the third generation, this measurement method can also be used in a time-resolved mode. In order to keep the construction and adjustment time as short as possible, a simple, compact and transportable reflectometer is to be built in order to give other users easy access to this measurement technology. Here we would like to present the current status of the project with the first measurements.