SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 31: Focus Session: Ion Beam Interaction with Surfaces and 2D Materials III

O 31.6: Vortrag

Dienstag, 28. März 2023, 12:00–12:15, GER 38

Particle emission from 2d materials induced by highly charged ion impact — •Lucia Skopinski¹, Lars Breuer¹, Silvan Kretschmer², Arkady V. Krasheninnikov², and Marika Schleberger¹ — ¹Universität Duisburg-Essen, Duisburg, Germany — ²Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany

Two-dimensional (2d) materials such as graphene or transition metal dichalcogenides are expected to be key materials for novel applications. Defect engineering by highly charged ion (HCI) beams could be a way to modify their unique properties even further. An ion carries energy in the form of kinetic energy E_kin and potential energy E_pot, the latter corresponding to the energy required to create its respective charge state. Once the ion impinges on the surface, its energy is deposited into the solid and can lead to modifications and sputtering. However, the fundamental mechanisms of defect formation due to HCI-surface interaction are still under investigation.
Here, we discuss the emission of secondary ions and atoms as well as their velocity distribution from a substrate supported 2d material under HCI irradiation. The measured distributions allow a distinction between sputtering driven by the potential and the kinetic energy of the primary ion. The potential sputtering yield of MoS₂ has a similar dependence on the potential energy as the pore formation found in freestanding MoS₂ after irradiation with HCIs. The low velocities of the emitted particles indicate an interaction mechanism connected to electron-phonon coupling.