SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 31: Focus Session: Ion Beam Interaction with Surfaces and 2D Materials III

O 31.7: Vortrag

Dienstag, 28. März 2023, 12:15–12:30, GER 38

Highly charged ion-induced electron emission from atomically thin materials — •Anna Niggas¹, Karsten Balzer², Matthias Werl¹, Friedrich Aumayr¹, Michael Bonitz³, and Richard Arthur Wilhelm¹ — ¹TU Wien, Institute of Applied Physics, Vienna, Austria — ²Computing Center of Kiel University, Kiel, Germany — ³Kiel University, Institute for Theoretical Physics and Astrophysics, Kiel, Germany

When a highly charged ion impacts on a material surface, its potential energy, i.e., the sum of the binding energies of all missing electrons, is deposited within the very first surface layers. This, in turn, triggers many processes such as the emission of electrons. While both the electron yield and energy distribution of bulk samples have been extensively studied in the past, data for 2D materials is rather scarce. This is due to the challenging task of separating signals of the 2D material itself from its support structure. Therefore, we developed a coincidence setup correlating ions after transmission with electrons emitted from the material. This allows us to discriminate signals from the support via the ion energy loss in the sample and, consequently, to access the emission from the 2D material alone.

In this contribution we will present our recent studies on the electron emission induced by highly charged ion impact on monolayers of graphene and MoS₂ and their 3D counterparts. We find a 6-fold higher emission yield for graphene compared to MoS₂ and a vanishing contribution of <10 eV electrons for MoS₂. These findings are supported by simulations of the ion-induced surface charge dynamics.