SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 54: Focus Session: Scanning Probe Microscopy with Quartz Sensors II

O 54.1: Topical Talk

Mittwoch, 29. März 2023, 15:00–15:30, CHE 89

Peering into interfacial water by qPlus-based atomic force microscopy — •Ying Jiang — International Center for Quantum Materials, School of Physics, Peking University, Beijing 100871, P. R. China

Water/solid interfaces are a central theme across an incredibly broad range of scientific and technological processes. Scanning probe microscopy (SPM) has been extensively applied to probe interfacial water, but there exist two longstanding limitations in the past decades, which makes SPM fall short compared with conventional spectroscopic methods. First, it is very difficult to image H atoms of water molecule directly; Second, it is highly possible to disturb the fragile H-bonding water structure during the imaging process. To this end, we have developed a new imaging method based on qPlus-type atomic force microscopy (AFM), which is sensitive to H and non-invasive to water structure. The key lies in probing the high-order electrostatic force between the quadrupole-like CO-terminated tip and the polar water molecules at large tip-water distances. In this talk, I will showcase the application of this technique to probe water clusters, ion hydrates, 2D ice and even bulk ice surface [1-4]. The possibility of combing qPlus-AFM with quantum sensing technology to perform nanoscale NMR measurement of interfacial water will be also briefly discussed [5-6].

[1] Nature Commun. 9, 122 (2018) [2] Nature 557, 701 (2018) [3] Nature 577, 60 (2020) [4] Science 377, 315 (2022) [5] Nature Commun. 12, 2457 (2021) [6] Nature Physics 18, 1317 (2022)