SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 54: Focus Session: Scanning Probe Microscopy with Quartz Sensors II

O 54.5: Topical Talk

Mittwoch, 29. März 2023, 16:15–16:45, CHE 89

AFM with the qPlus sensor: An indeal tool for oxide surface science — •Ulrike Diebold — Institute of Applied Physics, TU Wien, Vienna, Austria

The past decades have seen a sustained interest in the atomic-scale properties of metal oxide surfaces. Local probes are well suited to study surface reconstructions, (point) defects, trapped local charges, and the adsorption of small molecules. Much of the work has focused on semiconducting or (ultra-)thin film samples, as these have sufficient conductivity for STM investigations. The superior resolution afforded by the qPlus sensor allows for extending such studies to highly insulating oxides, such as silicates or other minerals. In the talk, I will give an overview of recent progress, fascinating opportunities, and challenges of atomically-resolved AFM on oxides.