SKM 2023 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 58: Plasmonics and Nanooptics II: Light-Matter Interaction and Spectroscopy I
O 58.4: Vortrag
Mittwoch, 29. März 2023, 16:00–16:15, WIL A317
Layer-resolved resonance intensity of evanescent polariton modes — Nikolai C. Passler1, Giulia Carini1, Dmitry N. Chigrin2,3, and •Alexander Paarmann1 — 1Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin — 2DWI - Leibniz-Institut für Interaktive Materialien, Aachen — 3Institute of Physics (1A), RWTH Aachen University, Aachen
Most nanophotonic approaches rely on polaritons to confine light to the nanoscale. In particular heterostructures of strongly anisotropic polar crystals have been of key interest recently, where the twist angles between different anisotropic layers key be leveraged to create and control exotic polaritonic states [1]. To guide the designs of such multi-parameter systems, low-cost simulation tools are invaluable. Common approaches like employing the reflection coefficient under evanescent excitation enable analysis of the polariton resonances without the need to specify the exact experimental arrangement, but lack layer-specific information. Here [2], we introduce a formalism based on a 4x4 transfer matrix algorithm [3] and energy flow analysis using the Poynting vector [4], that provides full depth-resolved information even for evanescent wave excitation. We illustrate the power of the approach by analysing a state-of-the-art example of twisted bilayer molybdenum trioxide [1].
[1] G. Hu, et al., Nature 582, 209 (2020).
[2] N.C. Passler, et al., arXiv preprint, arXiv:2209.00877 (2022).
[3] N.C. Passler & A. Paarmann, JOSA B 34, 2128 (2017).
[4] N.C. Passler, et al., PRB 101, 165425 (2020).