SKM 2023 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 66: Poster: Scanning Probe Microscopy with Quartz Sensors
O 66.10: Poster
Mittwoch, 29. März 2023, 18:00–20:00, P2/EG
Electrostatic Discovery Atomic Force Microscopy — Niko Oinonen1, •Chen Xu1, Benjamin Alldritt1, Prokop Hapala2, Filippo Federici Canova1,3, Fedor Urtev1,4, Shuning Cai1, Ondřej Krejčí1, Juho Kannala4, Peter Liljeroth1, and Adam S. Foster1,5 — 1Department of Applied Physics, Aalto University, 00076 Aalto, Espoo, Finland — 2FZU - Institute of Physics of the Czech Academy of Sciences, 182 21 Prague 8, Czechia — 3Nanolayers Research Computing Ltd., London N12 OHL, United Kingdom — 4Department of Computer Science, Aalto University, 00076 Aalto, Espoo, Finland — 5WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan
While offering high resolution atomic and electronic structure, scanning probe microscopy techniques have found greater challenges in providing reliable electrostatic characterization on the same scale. In this work, we offer electrostatic discovery atomic force microscopy, a machine learning based method which provides immediate maps of the electrostatic potential directly from atomic force microscopy images with functionalized tips. We apply this to characterize the electrostatic properties of a variety of molecular systems and compare directly to reference simulations, demonstrating good agreement. This approach offers reliable atomic scale electrostatic maps on any system with minimal computational overhead.