SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 66: Poster: Scanning Probe Microscopy with Quartz Sensors

O 66.3: Poster

Mittwoch, 29. März 2023, 18:00–20:00, P2/EG

Distance dependence of s- and p-wave contributions in CO-tip STM — •Leonard-Alexander Lieske, Fabian Paschke, Florian Albrecht, and Leo Gross — IBM Research Europe - Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland

Funtionalized tips are frequently used in high-resolution AFM, particularly CO terminated tips, to facilitate atomic resolution [1]. CO functionalized tips can also enhance contrast in STM measurements of ionic resonances, mapping orbital densities [2,3]. For CO tips both s- and p-wave character of the tip contribute to the contrast [3,4,5]. Here, we study the contributions of s- and p-wave character of CO tips as a function of tip height, bias voltage and tunneling current.

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[2] J. Repp, G. Meyer, S. M. Stojković, A. Gourdon and C. Joachim, Physical Review Letters, 94(2) 026803 (2005).
[3] L. Gross, N. Moll, F. Mohn, A. Curioni, G. Meyer, F. Hanke and M. Persson, Physical Review Letters, 107(8), 086101 (2011).
[4] N. Pavliček, I. Swart, J. Niedenführ, G. Meyer and J. Repp, Phys. Rev. Lett. 110, 136101 (2013).
[5] A. Gustafsson and M. Paulsson, Phys. Rev. B, 93, 115434 (2016).