SKM 2023 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 70: Poster: Plasmonics and Nanooptics II
O 70.10: Poster
Mittwoch, 29. März 2023, 18:00–20:00, P2/EG
Fabrication of STM+AFM+TERS tips — •Petr Kahan, Jiří Doležal, Amandeep Sagwal, Rodrigo Ferreira, and Martin Švec — Institute of Physics, Czech Academy of Sciences; Cukrovarnická 10/112, CZ16200 Praha 6, Czech Republic
Although many highly reproducible techniques[1,2,3] exist for scanning tunneling microscopy (STM) tip preparation suitable for Tip-enhanced Raman spectroscopy (TERS), none of them was employed in non-contact atomic force microscopy (nc-AFM) relying on a lightweight tip glued to the tuning fork. Here we investigate the effects of commercially available and safe metallurgy etchants[3] on STM/nc-AFM tip fabrication from plasmonic metals[4]. We devised a simple optical apparatus for quick tip quality assessment. This allows us to see the Raman and plasmon scattering of the tip surface in various stages of preparation and determine its suitability for TERS. This might pave the way towards the first demonstration of combined STM/nc-AFM and TERS with submolecular resolution with the same tip [5] .
[1] Sasaki, S. S. et al. Rev. Sci. Instrum 84, 096109 (2013) [2] Yang, B. et al. JPCC 122, 16950-16955 (2018) [3] Walker, P. & Tarn, W. H. CRC handbook of metal etchants (CRC press, 1990) [4] Murray, W. A. & Barnes, W. L. Adv. Mater. 19, 3771-3782 (2007) [5] Xu, J. et al. Science 371 818-822 (2021)