SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 97: Focus Session: Scanning Probe Microscopy with Quartz Sensors IV

O 97.1: Vortrag

Freitag, 31. März 2023, 10:30–10:45, TRE Ma

qPlus-based Lateral Force Microscopy — •Alfred J. Weymouth — Universität Regensburg, Regensburg, Deutschland

Lateral force microscopy (LFM) is a branch of AFM in which a component of force perpendicular to the surface normal is measured. Long-range forces have no lateral component over a flat terrace, making LFM ideal to study short-range forces. We have established methods to extract force and potential energy from our observations, and applied these methods to study a number of systems including molecular bending. We have also studied the interaction at the side of a molecular adsorbate, and more recently shown that we can measure the energy dissipation as we pull a molecule at the tip over the surface.

Giessibl et al., Proc. Nat. Acad. Sci. 99, 12006 (2002); Weymouth et al., Science 343, 1120 (2014); Weymouth, J Phys.: Condens. Matter 29, 323001 (2017); Weymouth et al., Phys. Rev. Lett. 124, 196101(2020); Weymouth et al, J. Jap. Appl. Phys. 61, SL0801 (2022)