SMuK 2023 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

T: Fachverband Teilchenphysik

T 43: Electronics, DAQ, Exp. Methods

T 43.2: Talk

Tuesday, March 21, 2023, 17:15–17:30, POT/0106

A Software-Scalable ADC in 28nm CMOS for Detector Readout — •Lukas Krystofiak — Forschungszentrum Jülich

Particle detector experiments rely more and more on advanced integrated circuits to achieve new discoveries. Their development is a lengthy and costly process, that poses a high threat to the overall success of a project. Using a pre-developed software-scalable ADC, adjustable in resolution and sample rate and ultimately in power consumption, catering to many different areas of applications, can decrease this risk substantially. While a generic approach will never reach the same performance as a dedicated development, it facilitates rapid prototyping and verification of readout methods prior to the building of the complete systems without the need to develop a dedicated chip. It also opens up possibilities for projects with smaller budgets. The key driver for this concept is the use of a bulk CMOS 28nm process technology, which allows incorporation of a powerful digital signal processor while analog performance and design is not too restricted. Here, the first iteration of a software-scalable ADC is shown. It features a high-precison mode with 11 Bit resolution and a maximum sample rate of 400 Megasample per second, and a low-power mode with 8 Bit resolution and 800 Megasample per second.