SMuK 2023 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 43: Electronics, DAQ, Exp. Methods

T 43.6: Vortrag

Dienstag, 21. März 2023, 18:15–18:30, POT/0106

Estimation of the van-der-Meer factorization bias using the Beam Imaging Method — •Konstantin Sharko and Andreas Meyer — Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany

At the CMS Experiment at the LHC, van-der-Meer (vdM) scans are used to calibrate the luminosity measurement. The beam imaging (BI) data, a special type of vdM-scan data, are used to estimate and correct biases coming from the assumption of transverse factorization of the proton-bunch densities. In BI scans one of the beams is kept at rest while the other one moves along the x- or y-axis.

In this analysis, the four scans, one for each of the two transverse orientations and two beams, are fit using combinations of Gaussian functions to extract the van-der-Meer factorization bias for LHC Run-2 and Run-3 data.