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AKBP: Arbeitskreis Beschleunigerphysik

AKBP 12: AKBP Poster Session

AKBP 12.4: Poster

Donnerstag, 21. März 2024, 11:00–14:00, Poster A

Investigation of annealed NbTiN thin films with field emisson scanning microscopy — •Frederic Braun¹, Isabel Díaz-Palacio², Florian Brockner¹, Robert Zierold², Wolfgang Hillert², and Dirk Lützenkirchen-Hecht¹ — ¹Bergische Universtiät Wuppertal — ²Universität Hamburg

Superconducting radio-frequency (SRF) cavities, primarily constructed from Niobium, are currently operating at or near their theoretical limits, leaving little room for significant improvements. Consequently, the exploration of alternative materials becomes imperative to push the boundaries of SRF cavity performance. A promising approach for achieving enhanced performance involves the deposition of superconducting thin films, such as NbTiN or Nb*Sn on the inner walls of the cavities. This study focuses on the analysis of NbTiN-coated samples using a Field Emission Scanning Microscope (FESM) to get critical insights into the field emission properties within an accelerating field. The measurement of current-voltage curves on the surface allows for the determination of the onset-field, where a sufficiently large current of, e.g., 1 nA is measured. Surface mapping reveals variations in onset-fields, attributed to film properties like surface roughness, impurities, and contamination from small particles and adsorbates. Moreover, conducting constant current measurements over an extended period provides valuable information regarding the long-term stability of the thin film surface. These analyses assess NbTiN-coated surfaces in SRF cavities, aiming to enhance efficiency in superconducting applications.

Keywords: FESM; NbTiN