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AKBP: Arbeitskreis Beschleunigerphysik

AKBP 3: Instrumentation and Beam Diagnostics I

AKBP 3.5: Vortrag

Montag, 18. März 2024, 16:00–16:15, E 020

Investigation of Ion Trapping and Beam-Induced Fluorescence at the Electron Cooler Test-Bench at HIM. — •Thomas Beiser — Helmholtz-Institut Mainz, Germany

Beam-current dependent and wavelength-resolved studies of the beam-induced fluorescence at the electron cooler test-bench recorded with a low-noise, cooled sCMOS-camera, will be presented. A high-voltage switch was utilized for beam interruptions, counteracting ion trapping.

Keywords: electron cooling; beam induced fluorescence