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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 28: Poster III

CPP 28.51: Poster

Wednesday, March 20, 2024, 11:30–13:30, Poster C

Advancing Microscopy Techniques for Plastic Analysis in Transmission Electron Microscope and Focused Ion Beam — •Judith Bünte, Inga Ennen, Laila Bondzio, and Andreas Hütten — Universität Bielefeld, Dünne Schichten und Physik der Nanostrukturen, Universitätsstr. 25, 33615 Bielefeld, Germany

Plastics play an essential role in various industries. Wanting to reduce plastic waste their analysis is necessary for advancing high-quality recyclate usage. While it is easy to downcycle pre-used plastics, we do not want to lose product quality in the recycling process. Here, we present our workflows for plastic analysis using Transmission Electron Microscope (TEM) and Focused Ion Beam (FIB) techniques. The goal is to explore diverse contrast enhancement techniques to unravel complex details of plastic structures. Understanding these structures is important for optimizing recyclate usage.

Our toolbox of experimental setups employs state-of-the-art TEM and FIB technologies, providing high-resolution insights into the morphology and composition of plastics. By investigating and comparing contrast enhancement methods, we aim to refine the imaging process and contribute to a more comprehensive understanding of plastic materials.

Keywords: Transmission Electron Microscope; Focused Ion Beam; Scanning Electron Microscope; Contrast Enhancement