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DS: Fachverband Dünne Schichten

DS 16: Focus Session: 2D Transition Metal Carbides, Nitrides and Carbonitrides III (joint session DS/MM/O)

DS 16.5: Vortrag

Donnerstag, 21. März 2024, 16:45–17:00, A 053

UV-to-IR Broadband Ellipsometry Characterization of Spray-Coated MXenes — •Andreas Furchner¹, Tetiana Hryhorchuk², Yury Gogotsi², and Tristan Petit¹ — ¹Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany — ²Drexel University (Nanomaterials Institute), Philadelphia, USA

The chemical composition of MXenes determines whether they exhibit metal-, semi-metal- or semiconductor-like properties, which is important knowledge regarding optoelectronic applications. We employ broadband ellipsometry to characterize the optical and structural properties of spray-coated MXene layers of different chemical composition on silicon and glass substrates. Measuring from the deep-UV (200 nm) to the mid-infrared (25 µm) provides simultaneous access to the electronic and free-charge-carrier properties of the MXenes, as well as to their vibrational fingerprints. Furthermore, ellipsometry enables the quantification of layer thicknesses, roughnesses and film inhomogeneities. The results are corroborated by Vis microscopy and atomic-force-microscopy (AFM) measurements. The authors acknowledge support from the Federal Ministry of Education and Research in the framework of the project Catlab (03EW0015A/B) and funding from the U.S. National Science Foundation (Grant Number CHE-2318105, M-STAR CCI).

Keywords: MXenes; Broadband ellipsometry; Free charge carriers; Electronic transitions; Film inhomogeneity