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DS: Fachverband Dünne Schichten

DS 2: 2D Materials and their Heterostructures I: hBN, WSe2, MoS2

DS 2.4: Talk

Monday, March 18, 2024, 10:15–10:30, A 060

Dielectric Function and exciton dynamics of 2-dimensional MoS2 — •Lucas Krätschmer1, Younes Slimi1, Lukas Trefflich2, Theo Pflug3, Markus Olbrich3, Noah Stiehm1, Bernd Hähnlein1, Sebastian Thiele1, Chris Sturm2, Alexander Horn3, Marius Grundmann2, Stefan Krischok1, and Rüdiger Schmidt-Grund11Technische Universität Ilmenau, Ilmenau, Deutschland — 2Universität Leipzig, Leipzig, Deutschland — 3Hochschule Mittweida, Mittweida, Deutschland

2-dimensional MoS2 belongs to the Transition Metal Dichalcogenide (TMD) family with a band gap of 1.7 eV, and thus has unique properties for optoelectronic applications. We present the dielectric function of a homogeneous MoS2 film deposited on a sapphire substrate with a size of 1cm x 1cm in the spectral range of 0.5 to 6.5 eV. The sample was purchased commercially from the company Ossila B.V.. The static optical properties of the sample were determined by spectroscopic ellipsometry (SE), spatially integrated as well as spatially resolved to survey the local optical properties of the sample. We found that the integrated as well as the local optical response is quite similar, showing high homogenity of the film. We found further indications for grain boundaries (grain size approx. 1 µm) from the Ψ- and Δ-Maps. Based on these results, time-resolved imaging ellipsometry measurements are planned to investigate the dynamics of the exciton propagation.

Keywords: MoS2; 2-dimensional materials; Ellipsometry

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