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Berlin 2024 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 21: Optical Analysis of Thin Films

Freitag, 22. März 2024, 09:30–12:15, A 053

09:30 DS 21.1 Hauptvortrag: Spotlight on Crystalline Textured Anilino-Squaraine Thin Films featuring Multiple Davydov Splitting and Charge Transfer Excitons — •Manuela Schiek
10:00 DS 21.2 Theory of X-ray excitation of two-dimensional materialsDominik Christiansen, Ivan Maliyov, •Joris Sturm, Malte Selig, Marco Bernardi, and Andreas Knorr
10:15 DS 21.3 Probing ultrafast dynamics employing a laser-driven broadband soft X-ray reflectometer — •Jasmin Jarecki, Martin Hennecke, Lutz Ehrentraut, Matthias Schnürer, Stefan Eisebitt, and Daniel Schick
10:30 DS 21.4 Synthesis, structure, and optical properties of Multi-Au capped Si nanoislands as a novel saturable absorber with a high modulation depthAli Karatutlu, Umut Taylan, •Zehra Gizem Mutlay, and Bülend Ortaç
  10:45 15 min. break
11:00 DS 21.5 Exploring the Tunability of Phonon Properties in Ultra-Thin Bismuth Films — •Felix Hoff, Timo Veslin, Abdur Rehman Jalil, Peter Kerres, Jonathan Frank, Thomas Schmidt, Yazhi Xu, Dasol Kim, Riccardo Mazzarello, and Matthias Wuttig
11:15 DS 21.6 Surface-Sensitive and Bulk-Suppressed Raman Scattering by Transferable Nanoporous Plasmonic Membranes — •Pietro Marabotti, Roman M. Wyss, Günter Kewes, Martin Frimmer, Karl-Philipp Schlichting, Markus Parzefall, Eric Bonvin, Martin F. Sarott, Morgan Trassin, Lala Habibova, Giorgia Marcelli, Marcela Giraldo, Jan Vermant, Lukas Novotny, Mads C. Weber, and Sebastian Heeg
11:30 DS 21.7 Thermal conductivitiy of hard-metal thin films microscopically resolved by Brillouin scattering — •Nils Denkmann, Donita Delijaj, Lasse Leukefeld, Nelson Filipe Lopes Dias, Finn Ontrup, Wolfgang Tillmann, and Jörg Debus
11:45 DS 21.8 Scanning Reflectance Anisotropy Microscopy: Strain Mapping of Metasurfaces and Beyond — •Fabian Haake, Joan Sendra, Henning Galinski, and Ralph Spolenak
12:00 DS 21.9 Exploring the optical constants of ruthenium (Ru) through EUV metrology:a study on thin films — •Samira Naghdi and Victor Soltwisch
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DPG-Physik > DPG-Verhandlungen > 2024 > Berlin