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HL: Fachverband Halbleiterphysik
HL 36: Poster III
HL 36.34: Poster
Mittwoch, 20. März 2024, 18:00–20:30, Poster E
Layered Minerals and Chalcogenides investigated by Atom Probe Tomography — •Jan Köttgen1, Alexander Kiehn2, Anna Vymazalová3, Yuan Yu1, and Matthias Wuttig1,2 — 11. Institute of Physics (IA), RWTH Aachen University, 52074 Aachen, Germany — 2JARA Institute "Green IT (PGI-10)", Forschungszentrum Jülich, 52428 Jülich, Germany — 3Czech Geological Survey, Geologická 6, 152 00, Prague, Czech Republic
Layered solids have recently attracted considerable attention due to the vast range of properties that can be realized in such layered systems. Layered chalcogenide compounds, in particular, exhibit a rich variety of structures. Some of these materials also employ metavalent bonding, which is a distinctive bonding mechanism initially discovered in crystalline phase change materials (PCM). The bonding between the atoms can be investigated by breaking these bonds in atom probe tomography. Compounds such as GeTe or Sb2Te3 exhibit unconventional properties indicative for the presence of metavalent bonding e.g. typically one electron per bond shared between atoms, and a high probability of multiple events observed in atom probe tomography. The aim of this project is to better understand the relation between layered solids and metavalent bonding, focusing on the transition metal chalcogenides PdTe2 and Pt3Te4, and comparing them with layered minerals like vihorlatite (Bi24Se17Te4). All layered systems investigated exhibit a high multiplicity during laser-assisted atom probe tomography, indicative for an unusual bonding mechanism. Further experiments will be presented which help to classify and understand these layered solids.
Keywords: Layered Chalcogenides; Van-der-Waals systems; Atom Probe Tomography; Minerals; Metavalent Bonding