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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 10: Diamond and Related Dielectric Materials I
KFM 10.6: Vortrag
Dienstag, 19. März 2024, 11:40–12:00, E 124
Examining atomic-scale material properties with an SnV electrometer in diamond — Gregor Pieplow1, •Cem G. Torun1, Joseph H. D. Munns2, Franziska M. Herrmann1, Andreas Thies3, Tommaso Pregnolato3, and Tim Schröder1 — 1Department of Physics, Humboldt-Universität zu Berlin, Newtonstr. 15, 12489 Berlin, Germany — 2PsiQuantum, 94304 California Palo Alto, USA — 3Ferdinand-Braun-Institut, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany
The transport of free charge carriers in solid-state materials, particularly in the presence of crystal defects, is an active area of research. Currently, existing in-situ sensing methods struggle to precisely localize single charges at the lattice scale. Our work introduces a sensor that is highly sensitive to single charges even amidst high-density background noise, common in wide-bandgap materials. We demonstrate the sensor principle using the tin-vacancy center in diamond, placed in a perturbed crystal lattice. The sensor allows us to pinpoint defect positions with high resolution, understand charge dynamics, and assess defect densities and formation yields. Importantly, this sensor aids in predicting optical performance in quantum technologies based on defect concentration, offering insights into achieving optimal optical coherence.
Keywords: lattice scale; sensor; electrometer; defect densities; diamond