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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 6: Instrumentation and Methods for Micro- and Nanoanalysis

Montag, 18. März 2024, 10:40–12:00, TC 010

Chair: Theo Scherer (KIT Karlsruhe)

	10:40	KFM 6.1	Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent beam electron diffraction — •Laura Niermann, Tore Niermann, Frederik Otto, and Michael Lehmann
	11:00	KFM 6.2	Planar Strain Tomography with X-ray Powder Diffraction — •Peter Modregger
	11:20	KFM 6.3	MULTIPAC, a versatile TDPAC spectrometer — •Björn Dörschel, Ian Yap, Thien Dang, Juliana Schell, Nicole De Lima, Magnus Hagelund, Bruno Correa, Arnaldo Filho, Alexandre Souza, and Doru Lupascu
	11:40	KFM 6.4	Emission Mössbauer Spectrometer from ILmenau (eMIL): An Update — Alice Kern, Juliana Schell, •Ian Chang Jie Yap, Thien Thanh Dang, Magnus Hegelund, Dmitry Zyabkin, and Peter Schaaf