Berlin 2024 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 9: KFM Poster Session

KFM 9.23: Poster

Monday, March 18, 2024, 18:00–20:00, Poster E

Nanoscale 3D chemical mapping of functional oxides using atom probe tomography — •Katharina Wolk, Kasper A. Hunnestad, Constantinos Hatzoglou, Julia Glaum, and Dennis Meier — Department of Materials Science and Engineering, Norwegian University of Science and Technology (NTNU), 7491 Trondheim, Norway

The functional properties of oxide materials are closely linked to their chemical composition and their three dimensional atomic-scale structure. To better understand the local defect-property relations in complex oxides and obtain quantitative information at the unit cell length scale, we apply atom probe tomography (APT). APT is an advanced analytical method that enables 3D compositional mapping with chemical sensitivity better than 100 ppm and sub-nanometer spatial resolution.

Here, I give a basic introduction to APT and present how to use focused ion beam (FIB) nanostructuring to prepare needle-shaped specimens for the analysis by APT. As an instructive example for information that can be extracted via APT analysis, I show a 3D needle reconstruction, which exhibits pronounced chemical variations at the nanoscale. Our research is applicable to a wide range of oxide systems, giving new opportunities for their characterization and defect-driven property engineering.

Keywords: atom probe tomography; APT; focused ion beam; FIB; chemical analysis