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MA: Fachverband Magnetismus
MA 18: Magnetic Imaging and Sensors I
MA 18.13: Vortrag
Dienstag, 19. März 2024, 12:45–13:00, EB 301
Non-invasive magnetic imaging and characterization of domain walls in synthetic antiferromagnets — •Ricardo Javier Peña Román1, Dinesh Pinto1,2, Sandip Maity1, Fabian Samad3,4, Olav Hellwig3,4, Klaus Kern1,2, and Aparajita Singha1 — 1Max Planck Institute for Solid State Research — 2Institute de Physique, École Polytechnique Fédérale de Lausanne — 3Institute of Ion Beam Physics and Material Research, Helmholtz-Zentrum Dresden-Rossendorf — 4Insititute of Physics, Chemnitz University of Technology
Understanding the local properties of the domain wall (DW) spin textures is crucial for developing, engineering, and controlling them for potential applications in magnetic storage devices and spintronics.
For investigating DWs in synthetic antiferromagnets, here we utilize a home-built nitrogen-vacancy (NV) scanning probe microscope that combines the spatial resolution of atomic force microscopy with the exceptional magnetic sensitivity of a single NV defect in diamond as a sensor. This technique, being independent of any external perturbation, is the least-invasive scanning probe approach available at room temperature. It also allows quantitative measurements of the stray magnetic fields generated by the sample. By performing measurements with two different orientations of the AFM NV-probe, we reveal distinct fingerprints emerging from spin noise and constant magnetic stray fields from the sample. Our work opens up novel opportunities for understanding magnetic thin films quantitatively and non-invasively, along with exceptionally high magnetic sensitivity at the nanoscale.
Keywords: NV center; Scanning NV-magnetometry; Relaxometry; Synthetic Antiferromagnets; Domain Walls