Berlin 2024 – scientific programme

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MA: Fachverband Magnetismus

MA 18: Magnetic Imaging and Sensors I

MA 18.2: Talk

Tuesday, March 19, 2024, 09:45–10:00, EB 301

Failure Analysis and Characterization of Microwave Fields using a Scanning NV Microscope — •Bjorn Josteinsson, Andrea Morales, Gabriel Puebla Hellmann, Jan Rhensius, and Simon Josephy — QZabre, Zurich, Switzerland

Imaging of nano-meter scale current flows and microwave fields is crucial for failure analysis and verification in microchip and waveguide design. Scanning NV (Nitrogen-Vacancy) is an ideal candidate for measurements of such devices, as it has both high sensitivity and high spatial resolution at ambient conditions. To measure nano-scale currents, ac quantum sensing techniques are employed, achieving a resolution of a few tens of nanometers and resolving current densities as low as 40 nA/um. For the characterization of microwave fields, such as those from waveguides and ion-traps, we measure the Rabi rate of the NV. This involves selecting a qubit from the NV's triplet state and tuning its transition frequency to match the frequency of the device under test, achieved by applying an external magnetic bias field. The microwave emission from the device drives Rabi oscillation of the NV, and the oscillation rate directly indicates the microwave field's strength. We show how such measurements yield a three-dimensional microwave field map over a coupled waveguide using a commercial scanning NV system.

Keywords: NV; Nitrogen Vacancy; Failure Analysis; Magnetism; Current distribution