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MA: Fachverband Magnetismus
MA 20: Poster I
MA 20.23: Poster
Dienstag, 19. März 2024, 16:30–19:00, Poster A
Soft x-ray detection of spin-orbit torque mediated magnetization switching and exchange bias effect in FeSi thin films — Victor Ukleev1, Chen Luo1, James Taylor1,2, Tomohiro Hori3,4, Yoshinori Tokura4,5, Naoya Kanazawa3, and •Florin Radu1 — 1Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany — 2Institute of Physics, Martin-Luther-University Halle-Wittenberg, Halle, Germany — 3Institute of Industrial Science, The University of Tokyo, Tokyo, Japan — 4Department of Applied Physics, University of Tokyo, Tokyo, Japan — 5RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan
The emergence of non-trivial magnetotransport in materials without inversion symmetry challenges the current understanding of magnetic phenomena and paves new ways of coupling spin and orbital degrees of freedom [1]. Recently a topological surface state emergent at the surface of chiral insulator FeSi has been demonstrated [2]. In contrast to bulk FeSi, this surface state has a metallic conductivity and ferromagnetic order below ~150 K. Here, we demonstrate a novel experimental technique based on polarization-dependent synchrotron soft x-ray spectroscopy that allows simultaneous detection of the anomalous Hall effect and bulk-sensitive fluorescence x-ray magnetic circular dichroism. The method allows us to detect spin-orbit torque switching of the surface state magnetization. Furthermore, we observe zero-field switching due to interface-induced exchange bias phenomena. [1] Soumyanarayanan, A. et al., Nature 539, 509*517 (2016). [2] Ohtsuka, Y., et al., Sci. Adv. 7, eabj0498 (2021).
Keywords: XMCD; spin-orbit torque switching; exchange bias