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MA: Fachverband Magnetismus
MA 22: Thin Films: Coupling Effects and Exchange Bias
MA 22.6: Vortrag
Mittwoch, 20. März 2024, 11:15–11:30, H 2013
Magnetometry of Buried Co-based Nanolayers by Hard X-ray Photoelectron Spectroscopy — •Andrei Gloskovskii1, Christoph Schlueter1, and Gerhard Fecher2 — 1Photon Science / DESY, Hamburg — 2Max Planck Institute for Chemical Physics of Solids, Dresden
The intensity and shape of photoelectron lines of magnetic materials depend on the relative orientation of the sample magnetization, the X-ray beam polarization and the spectrometer axis, i.e. the electron emission direction. In the hard X-ray regime, the beam polarization can be conveniently modified utilizing the phase shift produced by a diamond phase plate in the vicinity of a Laue or Bragg reflection. A single-stage in-vacuum phase retarder is installed and commissioned in 2020 at the HAXPES beamline P22 at PETRA III (Hamburg) [1].
The electronic and magnetic properties of CoFe, CoFeB and Co-based Heusler nanolayers were studied using the magnetic circular dichroism (MCD). Both the polarization-dependent spectra and the dichroism indicate that the lines of the multiplet extend over the entire spectral range. It is demonstrated that MCD in HAXPES is an effective and powerful technique to perform element and depth specific magnetometry of deeply buried ferromagnetic and antiferromagnetic magnetic materials. [1] C. Schlueter, A. Gloskovskii, K. Ederer et al., AIP conference proceedings 2054(1), 040010 (2019).
Keywords: CoFe; HAXPES; XPS; MCD