Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MA: Fachverband Magnetismus
MA 47: Poster III
MA 47.25: Poster
Donnerstag, 21. März 2024, 15:00–18:00, Poster D
Quantitative Magnetic Force Microscopy from nm to mm — •Christopher Habenschaden1, Sibylle Sievers1, Andrea Cerreta2, and Hans Werner Schumacher1 — 1Physikalisch-Technische Bundesanstalt, Braunschweig, Germany — 2Park Systems Europe GmbH, Mannheim, Germany
Magnetic Force Microscopy (MFM) is a well-established technique in Scanning Probe Microscopy (SPM) allowing imaging of magnetic samples with spatial resolution of tens of nm and stray fields down to the mT range.
Spatial resolution and field sensitivity can be pushed to several nm and the hundred µT range by measuring in vacuum conditions due to a higher Q-factor of the cantilever oscillation. This increasing field sensitivity, in turn, also allows increasing the working distance from the surface. We show that for µm-patterned magnetic samples, signals well above the noise floor are detectable even up to 100 µm above the surface. This enables scanning of mm-sized structures, which can be realized either by stitching 100 µm MFM scans or by much less time-consuming stage-scanning.
We present an implementation of both techniques into a Park Systems NX-Hivac vacuum SPM. A phase-locked loop-based signal detection is used to ensure high sensitivity and elimination of non-linearities. This setup enables MFM measurements to cover the full length range from the nm-regime up to several millimeters and thus to bridge the gap in spatially resolved magnetic field measurements from nano scale SPM to macroscopic measurements using optical indicator films.
Keywords: Quantitative Magnetic Force Microscopy; qMFM; MFM; Magnetic Force Microscopy; Scanning Probe Microscopy