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MA: Fachverband Magnetismus

MA 47: Poster III

MA 47.32: Poster

Thursday, March 21, 2024, 15:00–18:00, Poster D

Impact of ion bombardment on the magnetic proximity effect in Pt/Fe bilayers — •Mika Ossenschmidt¹, Maik Gaerner¹, Varun Vanakalapu², Arne Vereijken², Arno Ehresmann², and Timo Kuschel¹ — ¹Bielefeld University, Germany — ²University of Kassel, Germany

KeV-He ion bombardment of thin-film interfaces offers the opportunity to modify the interface properties of thin-film systems, including the roughness σ. In case of magnetic interfaces, the magnetic properties can be altered by low-sputter yield keV light ion bombardment without destroying the thin films, e.g. as shown for exchange-bias systems [1].

We have prepared samples of Pt 4.5nm/Fe 10nm//MgO(001) by sputter deposition and investigated the impact of ion bombardment on the magnetic proximity effect in Pt. The subsequent ion bombardment dose varied from 10¹⁵ to 10¹⁷ 1/cm². We measured x-ray resonant magnetic reflectivity [2,3] at the Pt L₃ absorption edge (11.568keV) at room temperature and in air at DESY beamline P09. The fits of the x-ray reflectivity measurements provide a significant difference for the roughness σ of the Pt/Fe interface due to ion bombardment while layer thicknesses, substrate roughness, and surface remained nearly unchanged. The resulting maximum Pt moment at the interface for the sample with ion bombardment is higher than without ion bombardment.

[1] Ehresmann et al., J. Phys. D: Appl. Phys. 38, 801 (2005)

[2] Macke et al., J. Phys.: Condens. Matter 26, 363201 (2014)

[3] Kuschel et al., Phys. Rev. Lett. 115, 097401 (2015)

Keywords: ion bombardment; magnetic proximity effect; x-ray resonant magnetic reflectivity