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MM: Fachverband Metall- und Materialphysik
MM 41: Focus Session: 2D Transition Metal Carbides, Nitrides and Carbonitrides I (joint session DS/MM/O)
MM 41.6: Talk
Wednesday, March 20, 2024, 16:45–17:00, A 053
Infrared and Raman spectroscopic analysis of functionalized graphene and Mxene layers — •Karsten Hinrichs1, Mailis Lounasvuori2, Fatima Akhtar2, Namrata Sharma2, Tristan Petit2, and Jörg Rappich2 — 1Leibniz-Institut für Analytische Wissenschaften - ISAS e.V., Application Laboratories Berlin, Schwarzschildstraße 8, 12489 Berlin, Germany — 2Helmholtz-Zentrum Berlin für Materialien und Energie GmbH 14109 Berlin, Germany
Functionalized 2D-conductive materials like graphene and Mxene layers are interesting templates for catalysis but are also important for building of optical and electro-chemical sensors. Spectroscopic Raman and infrared (IR) ellipsometry analysis can access complementary information on the conductive material but also the ultrathin functional organic layer, respectively. Thereby bands due to molecular vibrations and phonons as well as free carrier absorptions are related to chemical and structural material properties. We acknowledge financial support by the European Union through EFRE 1.8/13.
Keywords: Infrared ellipsometry; 2D-materials; Functionalization; Mxene; Graphene