Berlin 2024 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 47: Poster DS (joint session DS/MM/O)

MM 47.22: Poster

Mittwoch, 20. März 2024, 17:00–19:00, Poster B

Atomic-Scale Insights Into The Interlayer Characteristics of Thin-Layered Materials Using Ultra-high Vacuum Tip-Enhanced Raman Spectroscopy — •Soumyajit Rajak and Nan Jiang — University of Illinois Chicago, Chicago, USA

Optoelectronic properties of molecular thin films are controlled by the local nanostructures of a molecular arrangement. Probing the effect of the local environment of nanostructures is challenging because the spatial resolution of conventional optical spectroscopic techniques is limited by the diffraction limit of light. Coupling light with plasmonic nano-objects creates highly localized surface plasmons (LSPs), which allows us to break the diffraction limit. Herein we present a combined topographical and optical analysis of different surface-sensitive arrangements of molecules and 2D material heterostructures using angstrom-scale resolution scanning tunneling microscopy (STM) and ultra-high vacuum tip-enhanced Raman spectroscopy (UHV-TERS). TERS uses the apex of an STM tip made of a plasmonic metal to couple light to the near field. The Raman modes of the nanostructure underneath this tip are enhanced by the nano-confined surface plasmons which allows us to obtain chemical information with Angstrom scale spatial resolution. STM images combined with localized surface plasmon resonance-enhanced Raman signals reveal different adsorbate configurations of single molecule entities and a fundamental view of interfacial interactions. The atomic scale insights obtained into the local environment enable precise control over the fabrication of nanostructures with tailored optoelectronic properties.

Keywords: Surface Plasmon resonance; Raman Spectroscopy; nanostructures; heterostructures; Scanning Tunneling Microscopy