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MM: Fachverband Metall- und Materialphysik

MM 52: Topical Session: In Situ and Multimodal Microscopy in Materials Physics II

MM 52.5: Topical Talk

Donnerstag, 21. März 2024, 11:45–12:15, C 130

Probing the Atomic-Scale Internal Phases of Mutliferroic Domain Walls During Dynamics with In-Situ Biasining and Cryogenic STEM — •Michele Conroy — Department of Materials, London Centre for Nanotechnology, Imperial College London, Exhibition Road, London SW7 2AZ, U.K.

Dynamic multiferroic domain wall topologies overturn the classical idea that our nanoelectronics need to consist of fixed components of hardware. To harness the true potential of domain wall-based electronics, we must take a step back from the device design level, and instead re-look at the sub-atomic internal properties. With recent advances in experimental characterisation and theoretical calculation approaches, in the last 5 years reports of non-classic internal structures and functionalities within domain walls have become a common occurrence. As the region of interest is at the nanoscale and dynamic, it is essential for the physical characterisation to be at this scale spatially and time resolved.This presentation focuses on measuring the emergent phases within domain walls during dynamics via in-situ biasing 4D-STEM and EELS. Additionally to explore the low temperature magnetic phases we utilise in-situ cryogenic TEM holders.

Keywords: Cryogenic TEM; 4D-STEM; EELS; Multiferroic; In-situ