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MM: Fachverband Metall- und Materialphysik

MM 53: Data Driven Material Science: Big Data and Workflows VI

MM 53.6: Talk

Thursday, March 21, 2024, 11:45–12:00, C 243

High-resolution beyond the depth of field limit in 3D phase-contrast imaging using ptychographic multi-slice electron tomography — •Andrey Romanov¹, Min Gee Cho², Mary Cooper Scott^2,3, and Philipp Pelz¹ — ¹Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich Alexander-Universität Erlangen-Nürnberg, IZNF, 91058 Erlangen, Germany — ²University of California Berkeley, Berkeley, California 94720, United States — ³Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

In electron microscopy, achieving atomic resolution in large volumes remains challenging, despite progress in optics and computational algorithms. Electron ptychography allows 3D information extraction from a single position- and momentum-resolved (4D-STEM) dataset, but axial resolution is limited to around 3nm. A novel approach involving tilt-series 4D-STEM data and subsequent ptychographic and tomographic reconstruction surpasses previous constraints. Here, we present the reconstruction of a phase-contrast volume three times greater than the depth of field, enabling differentiation of individual atoms in all dimensions of a Co3O4 nanocube in an 18.2 nm side length volume. This advancement opens new possibilities for material exploration in atomic-level 3D imaging.

Keywords: Atomic Resolution; Ptychographic Electron Tomography; 4D-STEM; Large-scale Volume Imaging