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MM: Fachverband Metall- und Materialphysik

MM 60: Topical Session: In Situ and Multimodal Microscopy in Materials Physics III

MM 60.1: Vortrag

Donnerstag, 21. März 2024, 15:45–16:00, C 130

Field ion microscopy contrast in Pt-Ir-Au ternary alloys — •Shalini Bhatt, Shyam Katnagallu, Felipe F Morgado, Baptiste Gault, Christoph Freysoldt, and Jörg Neugebauer — Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf Germany

Field ion microscopy (FIM) allows to resolve the position of atoms in 3D, but the atoms chemical identity can be deduced only indirectly, by local contrast variations. Utilizing our recent EXTRA-FIM approach [1], which adapts the Tersoff-Hamann approach originally developed to Scanning tunneling microscopy (STM) to tunneling-controlled ionization in FIM, we demonstrate a chemical brightness contrast in ternary alloys featuring Pt, Au, and Ir. We correlate the contrast to the electronic structure of the surface, notably the local d-band filling. Yet, the relaxation pattern observed in Au significantly influences the FIM contrast. We, therefore, explore if the contrast information from FIM can be used to correctly interpret the chemical nature and local configurations in FIM experiments. We anticipate that our approach can expand the analytical capabilities of FIM.

[1] Bhatt, S., Katnagallu, S., Neugebauer, J., & Freysoldt, C Phys. Rev. B, 107(23), 235413 (2023)