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MM: Fachverband Metall- und Materialphysik
MM 60: Topical Session: In Situ and Multimodal Microscopy in Materials Physics III
MM 60.5: Talk
Thursday, March 21, 2024, 16:45–17:00, C 130
A Simple and Intuitive Model for Electric Potential Distributions Around TEM-Specimens — •Hüseyin Çelik1, Robert Fuchs2, Tolga Wagner1, and Michael Lehmann1 — 1Institute of Optics and Atomic Physics, Technische Universität Berlin, Straße des 17. Juni 135, 10623 Berlin, Germany — 2Institute of Theoretical Physics, Technische Universität Berlin, Hardenbergstraße 36, 10623 Berlin, Germany
For electron holographic investigations of externally driven real semiconductor nanostructures, a good understanding of the electric potential distribution of the TEM-specimen and the resulting stray fields, especially in electron beam direction, is of great importance. Here, a simple and intuitive model for the approximation of such potential distributions inside and outside semiconductor specimens of a p-n junction, prepared by a focused ion beam (FIB), is presented. The model uses only independent convolutions of the assumed specimen core's potential distribution with a suitable kernel. This allows for the entire potential distribution of a real specimen to be inferred from only one measured projection. Consequently, a significant reduction of the required computational power as well as a drastically simplified measurement process is achieved.
Keywords: Electron Holography; Focused Ion Beam (FIB) Preparation; Electric Potential Distribution; Semiconductor Nanostructures; Computational Efficiency