Berlin 2024 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 29: Poster: 2D Materials
O 29.32: Poster
Dienstag, 19. März 2024, 12:30–14:30, Poster A
Characterising nitrogen defects in graphene grown by bottom-up synthesis — •Liv Warwick1,2, Matthew A. Stoodley2,3, Jonathan Bradford1, Matthew Edmondson1, Benedikt P. Klein2,3, Fulden Eratam2, Henry P. Hoddinott2,4, Luke A. Rochford5, Reinhard J. Maurer3, David A. Duncan2, and Alex Saywell1 — 1University of Nottingham, Nottingham, UK — 2Diamond Light Source, Didcot, UK — 3University of Warwick, Coventry, UK — 4University of Swansea, Swansea, UK — 5University of Cambridge, Cambridge, UK
Recently, we have pioneered a new method for the growth of defective graphene, e.g. graphitic material containing heteroatoms or vacancies, [1] by `bottom-up' on-surface growth methodologies. In our chemical vapour deposition process [2] we use an aromatic precursor that contains the same structural element as our desired defects. Here, using a similar method, we will present a low temperature scanning tunnelling microscopy (LT-STM), X-ray photoelectron spectroscopy (XPS) and normal incidence X-ray standing waves (NIXSW) study of graphene containing nitrogen defects, grown from a nitrogen containing precursor. By transferring the samples between the different technique chambers via an ultra-high vacuum suitcase, we were able to correlate spectroscopic differences to morphological changes on the surface.
[1] Bhatt, M. D. et al. RSC Adv. 12, 21520-21547 (2022) [2] B. P. Klein. et al. Appl. Phys. Lett., 2022, 121, 191603.
Keywords: STM; Defective graphene; X-ray photoelectron spectroscopy; On-surface synthesis