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O: Fachverband Oberflächenphysik

O 4: New Methods: Experiments

O 4.7: Topical Talk

Monday, March 18, 2024, 12:00–12:30, MA 005

Focused and coherent X-rays for the study of thin films and surfaces — •Ivan Zaluzhnyy — Institute of Applied Physics, University of Tübingen, Germany

X-ray diffraction techniques have been extensively used to study the atomic structure of bulk materials and thin films. The rise of new bright synchrotron X-ray sources opens up a possibility to use coherent X-ray diffraction to investigate the structure and morphology of surfaces and thin films. X-ray photon correlation spectroscopy (XPCS) is one of such techniques, which utilizes coherent X-ray beams to study the equilibrium as well as non-equilibrium dynamics of the film surface.

The grazing incidence geometry, which is typically employed to be surface-sensitive, puts certain requirements on the experimental parameters, such as X-ray beam size and sample alignment. This talk will give a few examples of XPCS studies of the thin film surfaces and show recent results on the kinetics and dynamics during in situ growth of organic films [1].

We thank colleagues from University of Tübingen, DESY and ESRF for their contributions.

[1] I. Dax et al., New J. Phys. 23 (2023) 103033

Keywords: XPCS; coherence; X-ray diffraction