Berlin 2024 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 54: Scanning Probe Microscopy: Light Matter Interaction at Atomic Scales I
O 54.5: Vortrag
Mittwoch, 20. März 2024, 16:15–16:30, MA 041
Towards STM-based atomic-scale scanning near-field optical microscopy — •Fabian Schulz1, Jun Nishida2, Adnan Hammud3, Shuyi Liu4, Takashi Kumagai2, Martin Wolf3, Akitoshi Shiotari3, and Melanie Müller3 — 1CIC nanoGUNE, San Sebastian, Spain — 2Institute for Molecular Science, Okazaki, Japan — 3Fritz Haber Institute of the Max Planck Society, Berlin, Germany — 4Huazhong University of Science and Technology, Wuhan, China
Scattering-type scanning near-field optical microscopy (sSNOM) enables measuring the optical properties of surfaces with a lateral reslolution beyond the diffraction limit. Conventional sSNOM is based on cantilever atomic force microscopy with the resolution limited to typically 10 - 20 nm. Here, using plasmonic nanocavities in a low-temperature scanning tunneling microscope (LT-STM), we demonstrate the potential of STM-based sSNOM in the visible regime to reach a resolution of at least ∼1 nm. As a prerequisite for future plasmonic sSNOM using LT-STM, we investigate the interplay between the measured near-field signal and the gap plasmon formed inside the STM junction.
Keywords: scanning near-field optical microscopy; scanning tunneling microscopy; STM-induced light emission; nanoplasmonics