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O: Fachverband Oberflächenphysik

O 63: Poster DS (joint session DS/MM/O)

O 63.3: Poster

Mittwoch, 20. März 2024, 17:00–19:00, Poster B

Analysis of polarization dependent IR spectra of thin films — •Karsten Hinrichs¹, Andreas Furchner², Fatima Akhtar², Norbert H. Nickel², and Jörg Rappich² — ¹Leibniz-Institut für Analytische Wissenschaften - ISAS e.V., Application Laboratories Berlin, Schwarzschildstraße 8, 12489 Berlin, Germany — ²Helmholtz-Zentrum Berlin für Materialien und Energie GmbH 14109 Berlin, Germany

The interpretation of bands in polarization dependent infrared (IR) spectra of thin films is addressed. Several examples such as an isotropic polymer film and functionalized silicon surfaces will be discussed as case studies. It will be shown that the observed vibrational band properties depend on the measurement geometry, the film thickness, the materials dielectric functions, as well as the direction of the probing electromagnetic fields. Comparative Density Functional Perturbation Theory (DPFT) - calculations are used for analysis. The financial support by the Europäischer Fonds für regionale Entwicklung by EFRE 1.8/13 and ProFIT 10185407 as well as the Federal Ministry of Education and Research and the project CatLab (03EW0015A/B) is acknowledged.

Keywords: vibrational band; ultrathin film; molecular layer; polarimetry; infrared spectroscopy