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O: Fachverband Oberflächenphysik

O 93: Scanning Probe Techniques: Method Development

O 93.1: Vortrag

Donnerstag, 21. März 2024, 15:00–15:15, MA 043

Tip-to-tip approach for multi-probe scanning probe microscopy utilizing long-distance all-optical methods — •Philipp Lindner, Raluca Boltje, Jonas Koch, Stefan Krause, and Roland Wiesendanger — Department of Physics, University of Hamburg, Germany

In multi-probe scanning probe microscopy, scanning electron microscopy (SEM) is conventionally used to support the individual positioning of the probes. However, SEM is incompatible with the application of high magnetic fields, eventually contaminates high-quality sample surfaces, and is limited to close working distances. Here we present the employment of a Maksutov-Cassegrain telescope (MCT) and a high-irradiance focused fiber-optic illumination system to achieve a diffraction-limited optical resolution of 3 micrometers at a working distance greater than 50 cm for three-tip spin-polarized scanning tunneling microscopy experiments at low temperatures and high magnetic fields. The oblique angle between the MCT objective lens and the sample plane, in combination with Airy pattern interference between the probe tips and their mirror images reflected from the specular sample surface, is utilized for the three-dimensional positioning of the probe tips into overlapping scan ranges. In contrast to SEM-based approaches, our method is applicable to compact scanning probe microscopes installed into the confined geometries of a superconducting magnet cryostat.

Keywords: Multiprobe; Optical Tip Approach; Overlapping Scanranges; Scanning Tunneling Microscopy; Scanning Probe Microscopy