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O: Fachverband Oberflächenphysik

O 93: Scanning Probe Techniques: Method Development

O 93.5: Vortrag

Donnerstag, 21. März 2024, 16:00–16:15, MA 043

Single crystal diamond needles as sensor in scanning probe microscopy — •Stefan Schulte^1,2, Sven Just^1,3, Victor I. Kleshch⁴, F. Stefan Tautz^1,3, and Ruslan Temirov^1,2 — ¹Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Germany — ²II. Physikalisches Institut, Universität zu Köln, Cologne, Germany — ³Fundamentals of Future Information Technology, Jülich Aachen Research Alliance (JARA), Jülich, Germany — ⁴Moscow, Russia

It was recently demonstrated that an SPM tip carrying a quantum dot allows for the measurement of electrostatic surface potentials, in technique that is referred to as scanning quantum dot microscopy (SQDM) (Wagner et al., Phys. Rev. Lett., 2015). Here, we report on an attempt to fabricate a SQDM tip with a CVD-grown single crystal diamond needle (Kleshch et al., Phys. Rev. B, 2020; Kleshch et al., Carbon, 2021). Using the micro-manipulator inside a focussed ion beam microscope the diamond needle is attached to a needle sensor. The diamond tip needle sensor is then characterized by performing non-contact AFM and field emission experiments at room temperature UHV conditions. At elevated field emission currents of several hundred nanoamperes, a surface conductive layer forms on the diamond needle, that eventually allows us to observe electron tunneling between the tip and the surface.

Keywords: non-contact atomic force microscopy; diamond needle; scanning quantum dot microscopy; field emission; focussed ion beam