Berlin 2024 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 93: Scanning Probe Techniques: Method Development

O 93.8: Vortrag

Donnerstag, 21. März 2024, 16:45–17:00, MA 043

A versatile Peak Force IR variation for correlative nanoscale chemical and mechanical AFM-IR — •Martin Wagner, Qichi Hu, Chunzeng Li, Shuiqing Hu, Chanmin Su, and Peter Dewolf — Bruker Nano Surfaces, Santa Barbara CA 93117, USA

Nanoscale infrared (nano-IR) microscopy enables label-free chemical imaging and spectroscopy at the nanometer scale by combining atomic force microscopy (AFM) with infrared radiation. Over the last years, AFM-IR has been developed with different AFM modes: the original photothermal induced resonance enhanced mode and the recently developed surface sensitive technique are based on contact mode, while Tapping AFM-IR is built on tapping mode [1]. Peak Force Tapping based Peak Force infrared (PFIR) microscopy [2] has lately joined as another AFM-IR mode. All these nano-IR variations inherit the advantages and limitations of their respective AFM base mode. In this work, we focus on the capabilities offered by a PFIR-related approach, and illustrate those with examples on a variety of polymer samples. We discuss (1) the capability to perform simultaneous multimodal imaging collecting both mechanical properties such as elastic modulus together with chemical information, (2) methods to understand and decouple artifacts induced by variations in mechanical properties from the AFM-IR data, and (3) the combination with other AFM-IR techniques such as the surface sensitive mode while, at the same time, minimizing lateral forces to allow one to study soft & fragile samples.

[1] J. Mathurin et al., J. Appl. Phys. 131, 010901 (2022).

[2] L. Wang et al., Chem. Soc. Rev. 51, 5268 (2022).

Keywords: AFM-IR; nano-IR; photothermal; nanochemical; infrared spectroscopy