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O: Fachverband Oberflächenphysik

O 95: Electronic Structure of Surfaces II: Spectroscopy, Surface States

O 95.4: Vortrag

Donnerstag, 21. März 2024, 15:45–16:00, MA 144

VUV Polarimeter for Inverse Photoemission — •Pascal Jona Grenz, Patrick Geers, Lennard Strompen, and Markus Donath — Physikalisches Institut, Universität Münster, Germany

In photoemission (PE) experiments, the use of polarized light for excitation provides access to orbital information of the electronic states under investigation. In inverse photoemission (IPE), the equivalent is the analysis of the polarization of the emitted light. So far, this light-polarization analysis was neglected due to the much lower cross-section in IPE compared with PE and the lack of suitable optics in the VUV (vacuum ultraviolet) spectral range.

In this contribution, we present a VUV polarimeter for IPE. A mirror with a polarizing coating of high reflectivity in Brewster angle geometry is used. With the high reflectivity and polarization power, this provides an easy-to-use attachment to the established photon detector [1]. We performed IPE measurements of the well-studied Cu(111) surface state by detecting p- and s-polarized light separately. The data show a strong dependence of the photon intensity on the polarization directions. Our results are in accordance with polarization-dependent PE measurements of the occupied part of the surface state [2].

[1] Thiede et al., Meas. Sci. Technol. 29, 065901 (2018)

[2] Mulazzi et al., Phys. Rev. B 79, 165421 (2009)

Keywords: Photoemission; Inverse Photoemission; Polarization; Unoccupied electronic structure; Photoelectron Spectroscopy